{"id":3841,"date":"2021-01-27T09:16:32","date_gmt":"2021-01-27T00:16:32","guid":{"rendered":"https:\/\/www.ulvac.co.jp\/wiki\/?p=3841\/"},"modified":"2022-02-28T09:11:19","modified_gmt":"2022-02-28T00:11:19","slug":"process_g_sic_trench","status":"publish","type":"post","link":"https:\/\/www.ulvac.co.jp\/wiki\/en\/process_g_sic_trench\/","title":{"rendered":"SiC Trench etching"},"content":{"rendered":"
We provide dry etching technology to realize a trench structure that realizes miniaturization and low resistance of power devices.
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Round shape is required at the bottom of the trench structure to avoid electrolytic concentration in high pressure resistance applications<\/p>5357cc拉斯维加斯游戏官网
Since SiC is a hard and chemically stable material, it is difficult to achieve a high etching rate.<\/p>5357cc拉斯维加斯游戏官网
Low selectivity with SiO2 mask requires thick SiO2 mask<\/p>5357cc拉斯维加斯游戏官网
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Optimize etching conditions to control trench shape<\/p>5357cc拉斯维加斯游戏官网
A process that achieves both side wall smoothness and high selectivity<\/p>5357cc拉斯维加斯游戏官网