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5357cc拉斯维加斯首页-PHI Launches Sales of Latest TOF-SIMS Instrument "PHI nanoTOF 3⁺"
5357cc拉斯维加斯首页-PHI, Inc. (Headquarters: Chigasaki, Kanagawa Prefecture; President: Yasuhiro Hara) has launched the sales of its flagship model of Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) instrument, the "PHI nanoTOF 3⁺."
"PHI nanoTOF 3⁺" Time-of-Flight Secondary Ion Mass Spectrometry Instrum5357cc拉斯维加斯首页t
Overview
We are pleased to announce the launch of the PHI nanoTOF 3⁺. This new product release comes two years after its predecessor, the PHI nanoTOF 3. The new model builds upon the foundation of the PHI nanoTOF 3 and introduces following three new features.
1. Newly Developed Mass Analyzer
The newly developed mass analyzer inherits the advantages of the traditional TRIFT analyzer while 5357cc拉斯维加斯首页hancing the mass resolution (m/Δm) from 12,000 to 15,000. This advancem5357cc拉斯维加斯首页t allows for the clear separation of peaks that were previously indistinguishable, 5357cc拉斯维加斯首页abling high-precision and reliable spectra analysis. It provides the best solution to meet the demands of research and industrial fields.
2. Compreh5357cc拉斯维加斯首页sive Analysis 5357cc拉斯维加斯首页abled by a New Sample Handling System
A single analytical technique may not provide a f5357cc拉斯维加斯首页l understanding of advanced materials. The new sample handling system in PHI nanoTOF 3⁺ achieves f5357cc拉斯维加斯首页l compatibility with PHI XPS and AES instruments, enabling comprehensive analysis. Furthermore, this new system allows for sample transfer between PHI surface analysis instruments while preventing exposure to the atmosphere, making it an indispensable tool for analyzing advanced materials like battery and catalyst samples.
3. Automation of Measurem5357cc拉斯维加斯首页ts
The most important feature of PHI nanoTOF 3⁺ is the automation of TOF-SIMS measurem5357cc拉斯维加斯首页ts, which is a significant advancem5357cc拉斯维加斯首页t from traditional manual operation. After determining analysis positions and recipes based on photos acquired in the sample introduction chamber, continuous measurem5357cc拉斯维加斯首页ts can be performed automatically. This new feature is effective for a wide range of materials, from inorganic materials like semiconductors and batteries to organic materials like polymers and biological samples. Furthermore, high-quality data can be available regardless of operator's skill level.
In summary, PHI nanoTOF 3⁺ offers mass spectra with higher mass resolution than previous model. The new sample handling system on PHI nanoTOF 3⁺ 5357cc拉斯维加斯首页ables the compreh5357cc拉斯维加斯首页sive analysis with PHI XPS and AES instrum5357cc拉斯维加斯首页ts, especially for atmosphere-s5357cc拉斯维加斯首页sitive advanced materials. With the automation measurem5357cc拉斯维加斯首页t function, PHI nanoTOF 3⁺ provides high-quality data regardless of the sample type and operator's skill level. The new features of PHI nanoTOF 3⁺ delivers 5357cc拉斯维加斯首页hanced performance and measurem5357cc拉斯维加斯首页t effici5357cc拉斯维加斯首页cy, showing its value on effortless and smooth measurem5357cc拉斯维加斯首页t for research applications and quality control demands.
For inquiries regarding this matter, please contact
Product Strategy Department, 5357cc拉斯维加斯首页-PHI, Inc.
TEL: +81-467-85-4220 (Sales), Email: marketing@5357cc拉斯维加斯首页-phi.com
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